Channel® Seed with SmartStax PRO® & VT4PRO™ Technology
Trait Innovations for Corn Pest ProtectionLead the field with the RNAi Technology of SmartStax® PRO, the all-in corn rootworm fighter, and VT4PRO™, Bayer’s widest spectrum of defense. With Bayer’s latest trait technology, you can keep one step ahead of ever-changing pest pressure and protect your crop throughout the season.
Channel Seed and VT4PRO for Above & Below Ground Corn Pests
Leading Channel® brand corn products with VT4PRO™ with RNAi Technology had a 4.8 bu/A advantage* over the competition. Protect your fields from corn rootworm, corn earworm, corn borer, fall armyworm, black cutworm & more with Bayer Traits widest spectrum of defense.
Channel and SmartStax PRO for High Pressure Corn Rootworm Environments
SmartStax PRO with RNAi Technology provides more than double the root node protection** against competitive products. Protect your yield potential from high pressure corn rootworm environments with the help of SmartStax PRO’s six modes of action.
Manage Corn Pest Pressure with Bayer Traits, Tools, & Resources
Above-ground insects and below-ground corn rootworm feeding can impact corn yield potential in your acres. Explore Bayer corn trait technologies, tools and resources to help you address your field's unique pest pressure.
Channel & Bayer Traits Solutions for Your Agronomic Challenges
Corn Rootworm Management Resources
Farmers need to re-evaluate their corn rootworm pressure each year as the threat continues to evolve. View our corn rootworm management tools, trait solutions, and more, to re-evaluate & manage your pest pressure.
Channel SeedPros Know Corn Traits
Learn how your Channel SeedPro can help put the RNAi Technology of SmartStax PRO or VT4PRO to work in your fields.
*Based on Bayer 2023 Market Development data generated in corn growing geographies over 149 locations, 325 comparisons of Channel® brand’s top 6 yielding corn products with VT4PRO™ with RNAi Technology vs national competitors containing similar traits within -3/+1 RM.
**Tinsley, N.A., Estes, R.E., and Gray, M.E. 2012. Validation of a nested error component model to estimate damage caused by corn rootworm larvae. Journal of Applied Entomology. DOI:10.1111/j.1439- 0418.2012.01736.x.
***NoPurchNec. Ends 7/7/25. Open to U.S. commercial corn farmers, 21+. Full rules, eligibility, restrictions, and details at https://traits.bayer.com/thewatchofficialrules